| 000 | 01942cam a22003858i 4500 | ||
|---|---|---|---|
| 015 |
_aGBB9E7484 _2bnb |
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| 016 | 7 |
_a019521176 _2Uk |
|
| 020 |
_a9781119417644 _q(epub) |
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| 020 | _a1119417643 | ||
| 020 |
_a9781119417620 _q(adobe pdf) |
||
| 020 | _a1119417627 | ||
| 020 |
_z9781119417583 _q(cloth) |
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| 020 |
_a9781119417651 _q(electronic bk.) |
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| 020 |
_a1119417651 _q(electronic bk.) |
||
| 020 | _z1119417589 | ||
| 037 |
_a9781119417644 _bWiley |
||
| 040 | _cCUS | ||
| 100 | 1 |
_aWatts, John F., _eauthor. |
|
| 245 | 1 | 3 |
_aAn introduction to surface analysis by XPS and AES / _cJohn F Watts, The Surface Analysis Laboratory, Department of Mechanical Engineering Sciences, University of Surrey, John Wolstenholme. |
| 260 | _aSecond edition. | ||
| 260 | 1 |
_aHoboken : _bWiley, _c2019. |
|
| 263 | _a1910 | ||
| 300 | _a1 online resource | ||
| 520 |
_a"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- _cProvided by publisher. |
||
| 650 | 0 |
_aSurfaces (Technology) _xAnalysis. |
|
| 650 | 0 | _aElectron spectroscopy. | |
| 650 | 0 | _aPhotoelectron spectroscopy. | |
| 650 | 0 | _aAuger effect. | |
| 650 | 7 |
_aAuger effect. _2fast _0(OCoLC)fst00821304 |
|
| 650 | 7 |
_aElectron spectroscopy. _2fast _0(OCoLC)fst00906707 |
|
| 650 | 7 |
_aPhotoelectron spectroscopy. _2fast _0(OCoLC)fst01061561 |
|
| 650 | 7 |
_aSurfaces (Technology) _xAnalysis. _2fast _0(OCoLC)fst01139279 |
|
| 700 | 1 |
_aWolstenholme, John, _eauthor. |
|
| 856 | 4 | 0 |
_uhttps://doi.org/10.1002/9781119417651 _zWiley Online Library |
| 942 | _cEBK | ||
| 999 |
_c208861 _d208861 |
||