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		Optical Measurement of Surface Topography edited by Richard Leach. by Leach, Richard. Material type: Text Publication details: Chennai: Springer, 2011Availability: Items available for loan: Central Library, Sikkim University (1) Call number: 910 LEA/O. Place hold Add to cart (remove)
		Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource] / by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy. by Goldstein, Joseph I [author.] \| Newbury, Dale E \| Michael, Joseph R \| Ritchie, Nicholas W.M \| Scott, John Henry J \| Joy, David C. Edition: 4th ed. 2018.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: New York, NY : Springer New York : Imprint: Springer, 2018Online access: Click here to access online Availability: Items available for reference: Central Library, Sikkim University Not for loan (1) Call number: 620.11. Add to cart (remove)
		Looking Inside Jets [electronic resource] : An Introduction to Jet Substructure and Boosted-object Phenomenology / by Simone Marzani, Gregory Soyez, Michael Spannowsky. by Marzani, Simone [author.] \| Soyez, Gregory \| Spannowsky, Michael. Series: Lecture Notes in Physics ; 958Edition: 1st ed. 2019.Material type: Text; Format: electronic available online ; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2019Online access: Click here to access online Availability: Items available for reference: Central Library, Sikkim University Not for loan (1) Call number: 539.72. Add to cart (remove)

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