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Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource] / by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy. by Goldstein, Joseph I [author.] | Newbury, Dale E | Michael, Joseph R | Ritchie, Nicholas W.M | Scott, John Henry J | Joy, David C. Edition: 4th ed. 2018.Material type:  Text; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: New York, NY : Springer New York : Imprint: Springer, 2018Online access: Click here to access online Availability: Items available for reference: Central Library, Sikkim University Not for loan (1) Call number: 620.11.
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