American Legal Injustice: Behind the Scenes with an Expert Witness/ Emanuel Tanay
Material type: TextPublication details: Lanham: Jason Aronson, Inc, 2010Edition: 1st.edDescription: 293 pISBN: 0765707756Subject(s): Criminal justice, Administration of -- United States | Forensic psychiatry -- United States | Forensic psychiatrists -- United StatesDDC classification: 345.7305Item type | Current library | Call number | Status | Date due | Barcode | Item holds |
---|---|---|---|---|---|---|
General Books | Central Library, Sikkim University General Book Section | 345.7305 TAN/A (Browse shelf(Opens below)) | Available | P29919 |
Introduction --
The roots of injustice --
Science and the law --
The litigation process --
The cause and mode of death : a mistaken determination of suicide --
A killing is a killing is a killing, unless it isn't : varieties of homicide --
Ted Bundy : the pleasure of cruelty --
Innocent and on death row : Sterling Spann --
The Sam Sheppard saga --
The legacy of the John Hinckley, Jr., verdict --
Jack Ruby and Lee Harvey Oswald : the homicidal spectrum --
Andrea Yates : sanity based on insanity --
Epilogue.
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