TY  - BOOK
AU  - Zuo,Jian Min
AU  - Spence,John C.H.
TI  - Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience 
SN  - 9781493966073
AV  - TA404.6 
U1  - 620.11 23
PY  - 2017///
CY  - New York, NY
PB  - Springer New York, Imprint: Springer
KW  - Materials science
KW  - Lasers
KW  - Photonics
KW  - Nanochemistry
KW  - Nanoscale science
KW  - Nanoscience
KW  - Nanostructures
KW  - Nanotechnology
KW  - Solid state physics
KW  - Characterization and Evaluation of Materials
KW  - Optics, Lasers, Photonics, Optical Devices
KW  - Nanoscale Science and Technology
KW  - Solid State Physics
N1  - Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes
N2  - This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns
UR  - https://doi.org/10.1007/978-1-4939-6607-3
ER  -