An introduction to surface analysis by XPS and AES / John F Watts, The Surface Analysis Laboratory, Department of Mechanical Engineering Sciences, University of Surrey, John Wolstenholme.
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TextPublication details: Second edition. ; Hoboken : Wiley, 2019Description: 1 online resourceISBN: 9781119417644; 1119417643; 9781119417620; 1119417627; 9781119417651; 1119417651Subject(s): Surfaces (Technology) -- Analysis | Electron spectroscopy | Photoelectron spectroscopy | Auger effect | Auger effect | Electron spectroscopy | Photoelectron spectroscopy | Surfaces (Technology) -- AnalysisOnline resources: Wiley Online Library Summary: "The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- Provided by publisher.
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e-Books
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Central Library, Sikkim University | Not for loan | E-2937 |
Total holds: 0
"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- Provided by publisher.
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