Transmission electron microscopy a textbook for materials science/ (Record no. 153978)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00383nam a2200133Ia 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9780387765013 |
| 040 ## - CATALOGING SOURCE | |
| Transcribing agency | CUS |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.381 |
| Item number | WIL/T |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Williams, David B. |
| 245 #0 - TITLE STATEMENT | |
| Title | Transmission electron microscopy a textbook for materials science/ |
| Statement of responsibility, etc. | David B. Williams; C. Barry Carter |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York: |
| Name of publisher, distributor, etc. | Springer, |
| Date of publication, distribution, etc. | 2009. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | lxii, 760 p. |
| 505 ## - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to `See' Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.<br/> |
| 650 ## - SUBJECT | |
| Keyword | Transmission electron microscopy. |
| 650 ## - SUBJECT | |
| Keyword | Materials -- Microscopy. |
| 650 ## - SUBJECT | |
| Keyword | Microscopy, Electron, Transmission. |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Carter, C. Barry |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | General Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Full call number | Accession number | Date last seen | Copy number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Central Library, Sikkim University | Central Library, Sikkim University | General Book Section | 28/08/2016 | 621.381 WIL/T | P08762 | 28/08/2016 | c 3. | General Books |